A novel technique combining high-resolution synchrotron x-ray microtomography and x-ray diffraction for characterization of micro particulates

Author(s): David R Merrifield1, Vasuki Ramachandran1, Kevin J Roberts1, Wesley Armour2, Danny Axford2, Mark Basham2, Thomas Connolley2, Gwyndaf Evans2, Katherine E McAuley2, Robin L Owen

Date: 01/09/2011

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